Enhanced in-line detection, cleaning and repair of nano-scale defects
NanoMend aims to pioneer novel technologies for in-line detection, cleaning and repair of micro and nano scale defects for thin films coated on large area substrates. Examples include thin films used in the production of packaging materials, flexible solar panels, lighting and indoor and outdoor digital signage and displays.
Manufacturers today face a number of technological challenges. Micro and nano-scale defects can appear at any stage of their production system, resulting in reduced yield, efficiency and reduced product longevity and performance. Product quality may be increased by improving in-line cleaning and repair techniques of micro and nano-scale defects. Furthermore, manufacturers face the challenge of speed versus resolution. At higher speeds the performance of in-line quality control systems drops. It is therefore necessary to go beyond the current state-of-the-art, which is the objective of NanoMend.